dc.contributor.author |
Perera, Sanduni |
|
dc.contributor.author |
Wijayanayake, Annista |
|
dc.contributor.author |
Peter, Suren |
|
dc.date.accessioned |
2021-06-25T06:21:36Z |
|
dc.date.available |
2021-06-25T06:21:36Z |
|
dc.date.issued |
2021 |
|
dc.identifier.citation |
Perera, Sanduni,Wijayanayake, Annista & Peter, Suren(2021),Analysing the risk in the supply chain of apparel industry during an epidemic outbreak. International Conference on Industrial Engineering and Operations Management |
en_US |
dc.identifier.uri |
http://repository.kln.ac.lk/handle/123456789/22848 |
|
dc.description.abstract |
Companies try to continue in business but struggle because of disruptions they face in the supply chain (SC)' In this
research, it is explored the SC risks faced by th-e-apparel industry during an epidemic-outbreak' It aims to investigate
what type of risks are associated during an epidemif^outbreak and ho* iihas affected the SC' Further, it is investigated
which risks should be prioritized, hoi to develop a suitable model to identiff the SC risks and vulnerabilities' The
data is collected from literature, interviews and surveys from leading personnel in the Sri Lankan apparel industry' It
is then mapped in a vulnerability matrix, tested and vatidated. In this siudy, it is identified !!at lhe loss of international
key supplieis and order canceliations are the riskiest. A generalized vulnerability model is developed in this study
consiaeiing cost and time factors, however, it can be cusi=omized using different factors-and.risks depending on the
experienceland needs of the company. The study can be further developed to identify the SC risk mitigation strategies
that should be taken to mitigate the SC disruptions during an epidemic outbreak. |
en_US |
dc.publisher |
IEOM Society International |
en_US |
dc.subject |
Suppty Chain Disruptions, Supply Chain Risks, Epidemic Outbreak, Risk Model, Vulnerability Model |
en_US |
dc.title |
Analysing the risk in the supply chain of apparel industry during an epidemic outbreak |
en_US |