dc.contributor.author |
Gunawardena, K. |
|
dc.contributor.author |
Wijayanayake, A. |
|
dc.contributor.author |
Kavirathna, C. |
|
dc.date.accessioned |
2022-10-14T06:52:23Z |
|
dc.date.available |
2022-10-14T06:52:23Z |
|
dc.date.issued |
2021 |
|
dc.identifier.citation |
Gunawardena, K., Wijayanayake, A., & Kavirathna, C. (2021, December 1). Solve Manufacturer’s Pallet Loading Problem (MPLP) with Practical Warehouse Constraints. 2021 6th International Conference on Information Technology Research (ICITR). https://doi.org/10.1109/icitr54349.2021.9657364 |
en_US |
dc.identifier.uri |
http://repository.kln.ac.lk/handle/123456789/25315 |
|
dc.description.abstract |
This study presents a two-phase algorithm for
solving the Manufacturer’s Pallet Loading Problem (MPLP)
while considering overhang and stability constraints using a
block approach. The MPLP involves determining a loading
pattern that can load the most identical rectangular boxes onto
a larger rectangular pallet. The proposed model is developed to
obtain the maximum number of boxes that could be loaded onto
a layer considering and without considering the overhang
according to eight predetermined block arrangements (BAs) in
the first phase. Then, the obtained overhang solutions are
checked against the stability constraint in the second phase.
Finally, the maximum number of boxes per layer is determined
based on the results from the two phases. The validity and the
performance of the proposed algorithm have been tested on
available datasets in the literature. The proposed algorithm
increased the number of boxes per layer; one to six boxes while
considering overhang and stability, improving the pallet area
utilization by 2.5% up to 14.3% for the tested datasets. |
en_US |
dc.publisher |
International Conference on Information Technology Research |
en_US |
dc.subject |
Manufacturer’s Pallet Loading Problem (MPLP), overhang, stability, heuristic algorithm |
en_US |
dc.title |
Solve Manufacturer’s Pallet Loading Problem (MPLP) with Practical Warehouse Constraints |
en_US |