dc.contributor.author |
Kalingamudali, S.R.D. |
en_US |
dc.contributor.author |
Wismayer, A.C. |
en_US |
dc.contributor.author |
Woods, R.C. |
en_US |
dc.contributor.author |
Roberts, J.S. |
en_US |
dc.date.accessioned |
2014-11-19T04:45:22Z |
|
dc.date.available |
2014-11-19T04:45:22Z |
|
dc.date.issued |
1994 |
|
dc.identifier.issn |
0003-6951 (print) , 1077-3118 (online) |
en_US |
dc.identifier.uri |
http://repository.kln.ac.lk/jspui/handle/123456789/4052 |
|
dc.description.abstract |
Reduction of the surface recombination current components in Npn AlGaAs/GaAs heterojunction bipolar transistors has been achieved by overgrowing the emitter?mesas with an AlGaAs layer approximately 0.5 ?m thick. It was observed that the n=2 recombination current was reduced by ?90%, to about 10% of the original value, with a corresponding 13?fold increase in current gain for 270?20 ?m2 devices. In addition, devices with the same emitter?base area, but significantly different perimeters, were observed to have similar current gains and n=2 recombination current values. This was in contrast to devices fabricated without an overgrowth layer. These results suggest that the overgrowth layer causes a very significant reduction in the perimeter recombination current. |
en_US |
dc.publisher |
Applied Physics Letters |
en_US |
dc.subject |
Current gain increase |
en_US |
dc.subject |
AIGaAs/GaAs heterojunction bipolar transistors |
en_US |
dc.subject |
Overgrowth; Kalinga |
en_US |
dc.title |
Current gain increase in AlGaAs/GaAs heterojunction bipolar transistors using AlGaAs layer overgrowth |
|
dc.type |
article |
en_US |
dc.identifier.department |
Physics |
en_US |