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Characterization of Surface States at a Semiconductor Electrolyte Interface by Electroreflectance Spectroscopy

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dc.contributor.author Tomkiewicz M en_US
dc.contributor.author Siripala W en_US
dc.date.accessioned 2014-11-19T04:46:40Z
dc.date.available 2014-11-19T04:46:40Z
dc.date.issued 1983
dc.identifier.uri
dc.identifier.uri http://repository.kln.ac.lk/handle/123456789/4136
dc.description.abstract Supra bandgap and subband gap Electrolyte Electroreflectance is being used to characterize surface states at semiconductor liquid interfaces. The surface states can manifest themselves either through direct optical transitions as in the case of n - TiO2 - aqueous electrolyte interface or through their effect on the response of the Fermi level to small changes in the electrode potential as in the case of single crystal CdIn2Se4 in polysulfide solutions. en_US
dc.publisher Journal De Physique en_US
dc.subject Electrolytes; Spectrum analysis; Surfaces; Surfaces (Physics) en_US
dc.title Characterization of Surface States at a Semiconductor Electrolyte Interface by Electroreflectance Spectroscopy
dc.type article en_US
dc.identifier.department Physics en_US


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