| dc.contributor.author |
Helmer, R.L. |
en_US |
| dc.contributor.author |
Punyasena, M.A. |
en_US |
| dc.contributor.author |
Abegg, R. |
en_US |
| dc.contributor.author |
Alford, W.P. |
en_US |
| dc.contributor.author |
Celler, A. |
en_US |
| dc.contributor.author |
El-Kateb, S. |
en_US |
| dc.contributor.author |
Engle, J. |
en_US |
| dc.contributor.author |
Frekers, D. |
en_US |
| dc.contributor.author |
Henderson, R.S. |
en_US |
| dc.contributor.author |
Jackson, K.P. |
en_US |
| dc.contributor.author |
Long, S. |
en_US |
| dc.contributor.author |
Miller, C.A. |
en_US |
| dc.contributor.author |
Olsen, W.C. |
en_US |
| dc.contributor.author |
Spicer, B.M. |
en_US |
| dc.contributor.author |
Trudel, A. |
en_US |
| dc.contributor.author |
Vetterli, M.C. |
en_US |
| dc.date.accessioned |
2014-11-19T04:46:45Z |
|
| dc.date.available |
2014-11-19T04:46:45Z |
|
| dc.date.issued |
1997 |
|
| dc.identifier.uri |
http://repository.kln.ac.lk/handle/123456789/4139 |
|
| dc.description.abstract |
Cross sections have been measured up to 35 MeV excitation for the 76Se(n,p)76As reaction at five laboratory angles between 0� and 15�. The incident neutron energy was 198 MeV. The distribution of Gamow-Teller (GT) strength at excitation energies less than 10 MeV was deduced by carrying out a multipole decomposition of the data. The GT strength below 6 MeV excitation was found to be less than 0.9 units, in qualitative agreement with a quasiparticle random-phase approximation calculation. The present results have been compared with data from the 76Ge(p,n)76As reaction to obtain an estimate of a lower limit for the lifetime of 76Ge for ?? decay. The estimate is in qualitative agreement with the measured lifetime. |
en_US |
| dc.publisher |
Physical Review C |
en_US |
| dc.subject |
Physics; Physics- Experiments; Reaction time; Gamow-Teller |
en_US |
| dc.title |
Gamow-Teller Strength from the 76Se(n,p)76As Reaction: Implication for the Double Beta Decay of 76Ge |
|
| dc.type |
article |
en_US |
| dc.identifier.department |
Physics |
en_US |